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21176075
Semiconductor Material and Device Characterization IEEE Press 3rd Edition
88% of respondents would recommend this to a friend
Položka č.:
21176075
CZK 3541
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Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices.
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What Stands Out
Comprehensive Coverage
This edition offers extensive insights into semiconductor materials and device fabrication, providing a holistic understanding crucial for students and professionals in electronics and materials science.
Updated Techniques
Incorporating the latest characterization methods, this book equips readers with contemporary tools to effectively analyze semiconductor properties and performance, ensuring relevance in today's fast-paced technological landscape.
Practical Applications
Featuring real-world examples and case studies, it bridges theory and practice, making complex concepts accessible and applicable for engineers and researchers in the semiconductor industry.
Detaily produktu
- Updated third edition with the latest findings and developments in the field
- Covers new measurement techniques, interpretations, and applications
- Dedicated to characterization techniques for measuring semiconductor materials and devices
- Includes updated figures, examples, references, and new problems for each chapter
- Two new chapters added: Charge-Based and Probe Characterization, and Reliability and Failure Analysis
- Essential reading for graduate students and professionals in the semiconductor field
| Publisher | Wiley-IEEE Press |
| Publication date | June 29, 2015 |
| Edition | 3rd |
| Language | English |
| Print length | 800 pages |
| ISBN-10 | 0471739065 |
| ISBN-13 | 978-0471739067 |
| Item Weight | 2.11 pounds (960 grams) |
| Dimensions | 6.4 x 2 x 9.4 inches (16.3 x 5.1 x 23.9 cm) |
Who Should Buy?
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Engineering Students
Ideal for engineering students specializing in semiconductor technology and device fabrication for their coursework.
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Industry Professionals
Beneficial for professionals working in semiconductor manufacturing and research focusing on material properties and device performance.
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Research Scientists
Useful for researchers investigating the physical properties of semiconductor materials and their applications in device technology.
-
General Readers
Not suitable for laypersons seeking basic information on electronics without technical background in semiconductors.
POPIS PRODUKTU
Semiconductor Material and Device Characterization IEEE Press 3rd Edition
About This Item
Introducing the Semiconductor Material and Device Characterization 3rd Edition, the ultimate resource for those looking to delve into the world of device characterization. This groundbreaking textbook has been updated with the latest findings and is packed with invaluable insights and techniques to fully understand the characterization of semiconductor materials and devices. With a plethora of electrical and optical characterization methods, including specialized chemical and physical techniques, this book covers all aspects of characterizing semiconductor materials and devices. Whether you are a graduate student or a professional in the field of semiconductor devices and materials, this book is essential reading. What sets this latest edition apart is the addition of new pedagogical tools and updated information to keep you on the cutting edge of the field.
The revised figures and examples reflect the most current data and information, while the 260 new references provide access to the latest research and discussions in specialized topics. Additionally, each chapter now includes new problems and review questions, allowing you to test your understanding of the material. You'll also find fully updated and revised sections throughout the book to keep you up to date with the latest developments in the field. But that's not all, the Semiconductor Material and Device Characterization 3rd Edition also introduces two brand new chapters. The first chapter, "Charge-Based and Probe Characterization," explores charge-based measurement and Kelvin probes, as well as probe-based measurements such as scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. The second new chapter, "Reliability and Failure Analysis," delves into the intricacies of failure times, distribution functions, and discusses various topics including electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Authored by Dieter K.
Schroder, an internationally recognized authority in the field and recipient of multiple teaching awards, this book combines scholarly expertise with practical application. Dr. Schroder's extensive knowledge and experience make this book an invaluable resource for anyone seeking to deepen their understanding of semiconductor material and device characterization. Don't miss out on the opportunity to explore the world of semiconductor material and device characterization.
Get your copy of the Semiconductor Material and Device Characterization 3rd Edition today and take your knowledge to the next level.
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Semiconductors Editorial Review
"Semiconductor Material and Device Characterization" is a highly recommended reference book for professionals working in the field of semiconductor material and device. It is an incredible resource for engineers and materials scientists in need of a comprehensive guide. The book assumes a working knowledge of semiconductor physics, which is essential for getting the most out of the text. It is well-referenced and provides a thorough explanation of the principles behind various characterization techniques. Additionally, the book includes original references for those seeking more detailed information. Although primarily targeted at lab use, many readers have found this book valuable enough to include it in their personal libraries. Overall, "Semiconductor Material and Device Characterization" is Considered a must-have resource for anyone working in the semiconductor field.
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Klady
- Comprehensive and detailed guide for semiconductor material and device characterization
- Well-referenced with explanations of underlying principles
- Valuable resource for professionals in the field
Nevýhody
- Assumes a working knowledge of semiconductor physics, which may be challenging for beginners
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Služby a výhody
- Completely updated and revised 3rd edition of the landmark text
- Includes new pedagogical tools to assist readers
- Covers electrical and optical characterization methods
- Provides specialized chemical and physical techniques
- Contains two new chapters on charge-based and probe characterization and reliability and failure analysis
- Ideal for graduate students and professionals working in semiconductor devices and materials
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